Carrier-transport-path-induced switching parameter fluctuation in oxide-based resistive switching memory

Thermoelectric Seebeck effect in oxide-based resistive switching memory

Reversible resistive switching induced by an electric field in oxide-based resistive switching memory shows a promising application in future information storage and processing. It is believed that there are some local conductive filaments formed and ruptured in the resistive switching process. However, as a fundamental question, how electron transports in the formed conductive filament is stil...

Conducting Nanofilaments in Metal Oxide Resistive Switching Memory

Investigating bipolar resistive switching characteristics in filament type and interface type BON-based resistive switching memory

Available online 17 September 2012

Self-Compliant Bipolar Resistive Switching in SiN-Based Resistive Switching Memory

Here, we present evidence of self-compliant and self-rectifying bipolar resistive switching behavior in Ni/SiNx/n⁺ Si and Ni/SiNx/n++ Si resistive-switching random access memory devices. The Ni/SiNx/n++ Si device's Si bottom electrode had a higher dopant concentration (As ion > 1019 cm-3) than the Ni/SiNx/n⁺ Si device; both unipolar and bipolar resistive switching behaviors were observed for th...

Resistive switching characteristics of gallium oxide for nonvolatile memory application

Available online 25 October 2012